Displaying results 1 to 10 of 29.
Case Study IR microscopy for Silicon wafer inspection with short-wave infrared (SWIR) cameras Goldeye
Product Goldeye CL-008 XSWIR 2.2 TEC2
Product Goldeye CL-008 XSWIR 1.9 TEC2
Product Goldeye CL-008 Cool TEC1
Product Goldeye CL-008 TEC1
Product Goldeye G-033 TEC1
Product Goldeye CL-130 TEC1
Product Goldeye CL-034 XSWIR 2.2 TEC2
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